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dc.contributor.authorEccleston, Kimberleyen
dc.contributor.authorPlatt, Ianen
dc.date.accessioned2019-05-10T01:46:58Z
dc.date.available2019-01-11en
dc.date.issued2019-01-11en
dc.date.submitted2019-01-03en
dc.identifier.citationEccleton, K.W., & Platt, I.G. (2019). Identifying near-perfect tunneling in discrete metamaterial loaded waveguides. Electronics, 8(1),84. doi:10.3390/electronics8010084en
dc.identifier.issn2079-9292en
dc.identifier.urihttps://hdl.handle.net/10182/10636
dc.description.abstractMu-negative and epsilon-negative loaded waveguides taken on their own are nominally cut-off. In ideal circumstances, and when paired in the correct proportions, tunneling will occur. However, due to losses and constraints imposed by finite-sized constituent elements, the ability to experimentally demonstrate tunneling may be hindered. A tunnel identification method has been developed and demonstrated to reveal tunneling behavior that is otherwise obscured. Using ABCD (voltage-current transmission) matrix formulation, the S-parameters of the mu-negative/epsilon-negative loaded waveguide junction is combined with S-parameters of an epsilon-negative loaded waveguide. The method yields symmetric scattering matrices, which allows the effect of losses to be removed to provide yet clearer identification of tunneling.en
dc.format.extent17en
dc.language.isoenen
dc.publisherMDPIen
dc.relationThe original publication is available from - MDPI - https://doi.org/10.3390/electronics8010084en
dc.relation.urihttps://doi.org/10.3390/electronics8010084en
dc.rights© 2019 by the authors.en
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectevanescent field tunnelingen
dc.subjectmetamaterialsen
dc.subjectmu-negative materialen
dc.subjectepsilon-negative materialen
dc.subjectsplit-ring-resonatorsen
dc.subjectwaveguidesen
dc.titleIdentifying near-perfect tunneling in discrete metamaterial loaded waveguidesen
dc.typeJournal Article
lu.contributor.unitLincoln Universityen
lu.contributor.unitLincoln Agritechen
lu.contributor.unitResearch Management Officeen
lu.contributor.unit/LU/Research Management Office/2018 PBRF Staff groupen
dc.identifier.doi10.3390/electronics8010084en
dc.subject.anzsrc0906 Electrical and Electronic Engineeringen
dc.relation.isPartOfElectronicsen
pubs.issue1en
pubs.notesArticle ID 84en
pubs.organisational-group/LU
pubs.organisational-group/LU/Lincoln Agritech
pubs.organisational-group/LU/Research Management Office
pubs.organisational-group/LU/Research Management Office/2018 PBRF Staff group
pubs.publication-statusPublisheden
pubs.volume8en
dc.rights.licenceAttributionen
lu.identifier.orcid0000-0003-0113-4265
lu.identifier.orcid0000-0002-6893-2176


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