Verification of extended through-line deembedding

Abstract

A direct proof of the extended through-line (TL) deembedding method is given. Simulation results of rectangular waveguide devices are used to verify extended TL deembedding. These devices include lengths of matched waveguide and a half- height waveguide that have a cut-off frequency of about 3 GHz. Well-established theoretical models of rectangular waveguide are used to assess the accuracy of the deembedded S-parameters.