Eccleston, KW2017-08-242016-09-222016-112016-09-040018-9480EC9ZD (isidoc)https://hdl.handle.net/10182/8448Deembedding a device mounted between a pair of identical transitions requires the transition two-port parameters. These can be obtained using the through-line (TL) deembedding method requiring only through and uniform line deembedding standards. Other related deembedding methods introduce factors to scale a pair of eigenvectors to obtain the transition two-port parameters. In this paper, it is shown that these scaling factors are interdependent and provide a corrective reference plane adjustment. Moreover, the transition wave-transmission matrix can be factored into two wave-transmission matrices with one encapsulating the transition discontinuity and the other of a matched line to provide a corrective reference plane shift. This factorization permits incorporation of desired and corrective reference plane shifts, using data from a second matched line standard. With an emphasis on substrate-integrated waveguide, the proposed TL deembedding method is verified.pp.3887-3893en© 2016 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.through-reflect-line (TRL) deembeddingdeembeddingsubstrate-integrated waveguide (SIW)through-line (TL) deembeddingJournal Article10.1109/TMTT.2016.26077441557-9670ANZSRC::5103 Classical physics