Eccleston, KWPlatt, IG2019-05-102019-01-112019-01-112019-01-03Eccleton, K.W., & Platt, I.G. (2019). Identifying near-perfect tunneling in discrete metamaterial loaded waveguides. Electronics, 8(1),84. doi:10.3390/electronics80100842079-9292HJ4KL (isidoc)https://hdl.handle.net/10182/10636Mu-negative and epsilon-negative loaded waveguides taken on their own are nominally cut-off. In ideal circumstances, and when paired in the correct proportions, tunneling will occur. However, due to losses and constraints imposed by finite-sized constituent elements, the ability to experimentally demonstrate tunneling may be hindered. A tunnel identification method has been developed and demonstrated to reveal tunneling behavior that is otherwise obscured. Using ABCD (voltage-current transmission) matrix formulation, the S-parameters of the mu-negative/epsilon-negative loaded waveguide junction is combined with S-parameters of an epsilon-negative loaded waveguide. The method yields symmetric scattering matrices, which allows the effect of losses to be removed to provide yet clearer identification of tunneling.17 pagesen© 2019 by the authors.evanescent field tunnelingmetamaterialsmu-negative materialepsilon-negative materialsplit-ring-resonatorswaveguidesJournal Article10.3390/electronics8010084ANZSRC::0906 Electrical and Electronic Engineering2079-9292ANZSRC::4009 Electronics, sensors and digital hardwarehttps://creativecommons.org/licenses/by/4.0/Attribution