Identifying near-perfect tunneling in discrete metamaterial loaded waveguides
dc.contributor.author | Eccleston, KW | |
dc.contributor.author | Platt, IG | |
dc.date.accessioned | 2019-05-10T01:46:58Z | |
dc.date.available | 2019-01-11 | |
dc.date.issued | 2019-01-11 | |
dc.date.submitted | 2019-01-03 | |
dc.description.abstract | Mu-negative and epsilon-negative loaded waveguides taken on their own are nominally cut-off. In ideal circumstances, and when paired in the correct proportions, tunneling will occur. However, due to losses and constraints imposed by finite-sized constituent elements, the ability to experimentally demonstrate tunneling may be hindered. A tunnel identification method has been developed and demonstrated to reveal tunneling behavior that is otherwise obscured. Using ABCD (voltage-current transmission) matrix formulation, the S-parameters of the mu-negative/epsilon-negative loaded waveguide junction is combined with S-parameters of an epsilon-negative loaded waveguide. The method yields symmetric scattering matrices, which allows the effect of losses to be removed to provide yet clearer identification of tunneling. | |
dc.format.extent | 17 pages | |
dc.identifier | https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=elements_prod&SrcAuth=WosAPI&KeyUT=WOS:000457142800084&DestLinkType=FullRecord&DestApp=WOS_CPL | |
dc.identifier.citation | Eccleton, K.W., & Platt, I.G. (2019). Identifying near-perfect tunneling in discrete metamaterial loaded waveguides. Electronics, 8(1),84. doi:10.3390/electronics8010084 | |
dc.identifier.doi | 10.3390/electronics8010084 | |
dc.identifier.eissn | 2079-9292 | |
dc.identifier.issn | 2079-9292 | |
dc.identifier.other | HJ4KL (isidoc) | |
dc.identifier.uri | https://hdl.handle.net/10182/10636 | |
dc.language.iso | en | |
dc.publisher | MDPI | |
dc.relation | The original publication is available from MDPI - https://doi.org/10.3390/electronics8010084 - http://dx.doi.org/10.3390/electronics8010084 | |
dc.relation.isPartOf | Electronics | |
dc.relation.uri | https://doi.org/10.3390/electronics8010084 | |
dc.rights | © 2019 by the authors. | |
dc.rights.ccname | Attribution | |
dc.rights.ccuri | https://creativecommons.org/licenses/by/4.0/ | |
dc.subject | evanescent field tunneling | |
dc.subject | metamaterials | |
dc.subject | mu-negative material | |
dc.subject | epsilon-negative material | |
dc.subject | split-ring-resonators | |
dc.subject | waveguides | |
dc.subject.anzsrc | ANZSRC::0906 Electrical and Electronic Engineering | |
dc.subject.anzsrc2020 | ANZSRC::4009 Electronics, sensors and digital hardware | |
dc.title | Identifying near-perfect tunneling in discrete metamaterial loaded waveguides | |
dc.type | Journal Article | |
lu.contributor.unit | LU | |
lu.contributor.unit | LU|Lincoln Agritech | |
lu.contributor.unit | LU|Research Management Office | |
lu.contributor.unit | LU|Research Management Office|OLD QE18 | |
lu.identifier.orcid | 0000-0003-0113-4265 | |
lu.identifier.orcid | 0000-0002-6893-2176 | |
pubs.issue | 1 | |
pubs.notes | Article ID 84 | |
pubs.publication-status | Published | |
pubs.publisher-url | http://dx.doi.org/10.3390/electronics8010084 | |
pubs.volume | 8 |
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